Thank you for attending the American Association for Aerosol Research's (AAAR) 42nd Annual Conference

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Thank you for attending the American Association for Aerosol Research’s (AAAR) 42nd Annual Conference in Albuquerque, New Mexico!

We hope you enjoyed the hands-on instrumentation tutorial with Štefan Ošlaj and learned about our revolutionary OC/EC analyzer CASS. At the exhibitor showcase, Martin Rigler, PhD, presented the newest Aethalometer AE36 Measurements, where you explored instrument installation, practical guidelines, and technical and scientific aspects of setting up measurement parameters. You also had the chance to discuss two scientific posters with Martin Rigler: AE36 Aethalometer: Performance Demonstration and Application of Black Carbon Index and Exploring the Relationship Between Filter Loading Effect and Aethalometer Multiple Scattering Enhancement Factor C in an Urban Background Site. We hope the information we shared with you was valuable. Thank you for your engagement.

We hope your conference experience was fruitful, and we look forward to seeing you at the next one!